Articles by Ametek Materials Analysis Division - Spectroscopy
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Articles by Ametek Materials Analysis Division

Ametek Materials Analysis Division


Improved Sensitivity with the New Apollo XRF ML-50 Detector on the Orbis Micro-XRF Analyzer
February 1, 2013

The measurement of trace elements is important across a wide variety of materials characterization problems. When measuring small glass fragments collected from crime and accident scenes, forensics experts analyze trace strontium (Sr) and zirconium (Zr) typically unintentionally incorporated into the glass during manufacturing as one point of identification or comparison.

Headlines from LCGC North America and Chromatography Online
Teledyne EU - Validation of Volatile Organic Compound by USEPA Method 8260C
UCT NA - Determination of Pesticides in Strawberries Using QuEChERS Extraction, Quick QuEChERS Clean-up and GC/MS Detection
Teledyne NA - Achieving ppt Levels of Environmental Volatiles with a Headspace Sampler
Thermo Fisher Scientific EU - Simplifying Complex Multi-Residue Pesticide GC-MS/MS Methodology
Screening Drugs in Saliva
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