X-ray Analysis

Nov 01, 2017
Special Issues
The EDXRF method described here is a quick and economical procedure to check samples for their oxygen content to ensure that the material used for diesel fuel blending is really FAME-based and not mineral-oil based.
Nov 01, 2017
Special Issues
There has been a resurgence in the application of small-angle X-ray scattering for a large range of problems in materials science. This article highlights experimental requirements and applications, with examples drawn from protein solutions, porous structures, and polymers.
Nov 01, 2017
Special Issues
To test the accuracy of residual stress measurements made with portable X-ray devices, measured normal and shear stresses were compared with the applied (true) values for accuracy assessment. From those results, practical measurement and analysis protocols for precise and accurate stress measurements are proposed.
Jul 01, 2017
Spectroscopy
By Spectroscopy Editors
Several leading scientists discuss their work to advance XRF and XRD techniques.
Jul 01, 2017
Spectroscopy
An evaluation of the ability of XRF spectrometry to perform elemental impurity analysis of 12 elements in various pharmaceutical materials
Jun 28, 2017
These tables are supplementary to the “Atomic Perspectives” column installment “Using XRF as an Alternative Technique to Plasma Spectrochemistry for the New USP and ICH Directives on Elemental Impurities in Pharmaceutical Materials,” which was published in the July 2017 issue of Spectroscopy.
Oct 01, 2016
Spectroscopy
Many developments in the miniaturization of analytical instruments have enabled metal detection at extremely low concentrations, using techniques such as XRF, LIBS, and laserablation resonance ionization mass spectrometry (LA-RIMS). These new technologies are facilitating advances in areas such as space exploration, environmental studies, and pharmaceutical analysis.
Jul 01, 2016
Spectroscopy
By Spectroscopy Editors
Several leading scientists discuss recent developments and trends in XRF and XRD techniques.
Jun 08, 2016
By Spectroscopy Editors
Total reflection x-ray fluorescence (TXRF) spectrometry is an energy-dispersive x-ray technique that is used for elemental and chemical analysis, and is especially suitable for small-sample analyses. Ursula Fittschen, an assistant professor at Washington State University, is working on elemental microscopy and micro analysis. She has been using TXRF to analyze stainless steel metal release, and also airborne silver nanoparticles (NPs) from fabrics. Here, she describes the advantages and challenges of this technique.
May 01, 2016
Spectroscopy
Our annual review of products introduced at Pittcon or during the previous year, broken down by the following categories: accessories, atomic spectroscopy, components, imaging, mass spectrometry, mid-IR, NIR, NMR, Raman, software, UV-vis, and X-ray.
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