X-Ray Spectroscopy

May 01, 2007
Spectroscopy
The "fundamental parameters" approach to calibration in X-ray fluorescence is unique because it is based upon the theoretical relationship between measured X-ray intensities and the concentrations of elements in the sample. This theoretical relationship is based upon X-ray physics and the measured values of fundamental atomic parameters in the X-ray region of the electromagnetic spectrum. In this tutorial, an introduction to the means of calibration is provided based upon a simplified instrument–sample geometry, thus eliminating some of the mathematical details of the traditional derivations.
Sep 01, 2006
Spectroscopy
September 2006. The authors discuss the benefits of X-ray fluorescence (XRF) for the determination of elemental nutrients in foodstuffs and X-ray diffraction (XRD) for the measurement and characterization of different compounds used in the pharmaceuticals industry.
Jul 01, 2006
Spectroscopy
This tutorial reviews the mathematical models for dealing with interelement effects in optical emission and X-ray fluorescence spectrochemical analysis. Line overlaps and matrix effect corrections are examined.
Jul 01, 2006
Spectroscopy
Spectroscopy previews all of the events and happenings at the 55th Annual Denver X-Ray Conference, to be held August 7-11 in Denver, Colorado.
Sep 01, 2005
Spectroscopy
In this X-ray tutorial, the authors attempt to answer the frequently asked question, "How deep do the X-rays penetrate my sample?"
Jul 01, 2005
Spectroscopy
In this study X-ray absorption was used to determine the effect of pH on the coordination of lead to humin and sphagnum peat moss. The authors determined the oxidation state and the coordination of lead to both humin and sphagnum peat moss using X-ray near edge structure and extended X-ray absorption fine structure spectroscopy. In addition, inductively coupled plasma optical emission spectroscopy was used to determine the amount of lead bound to the humin and sphagnum peat moss in the pH range 2–6.
Jul 01, 2005
Spectroscopy
By Spectroscopy Editors
Spectroscopy previews products and sessions for attendees to see and participate in at the 54th Annual Denver X-Ray Conference, to be held August 1–5 in Colorado Springs, CO.
Jul 01, 2004
Spectroscopy
By Spectroscopy Editors
The Spectroscopy staff presents a sampling of new product introductions that you can expect to see at the show, as well as a summary of special session topics and workshop content.
Jul 01, 2003
Spectroscopy
The x-ray energy spectrum provides rapid identification of mineral samples.
Jul 01, 2003
Spectroscopy
This article provides a brief overview of some of the latest spectroscopy-related equipment and supplies scheduled to be introduced at the 2003 Denver X-ray Conference at the Denver Marriott Tech Center Hotel in Denver, Colorado, August 4?8, 2003.
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