Special Issues-08-01-2009

Special Issues

Analysis of Solar Silicon Using High-Throughput Spectroscopy

August 01, 2009

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Infrared spectroscopy is a powerful analysis technique used in the semiconductor industry to ensure the quality of silicon and silicon wafers. The authors discuss the use of an inexpensive, lab-based system to measure carbon and oxygen concentrations in silicon to the level of precision required by the solar silicon industry.

Detection and Sourcing of Counterfeit Pharmaceutical Products and Consumer Goods

August 01, 2009

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The authors discuss the use of vibrational spectroscopy to differentiate an authentic article from a counterfeit one throughout a product's lifecycle, from component receipt at the site of manufacture, to product receipt by the end user.

Letter from the Editor

August 01, 2009

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Whether used for traditional applications such as identifying counterfeit pharmaceuticals or in some of the more glamorous "CSI-type" forensic applications such as ink analysis, FT-IR technology continues to occupy a large and important space in the field of spectroscopy.

Polarization Measurement of Film Using Single-Reflection FT-IR–ATR

August 01, 2009

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Transmission methods are often affected by film thickness and can result in inaccuracies. Polarization measurement using attenuated total reflectance (ATR), a Fourier transform–infrared (FT-IR) technique, is offered as an alternate resource because it is not adversely affected by film thickness.

Index of FT-IR Articles in Spectroscopy: 2004–2009

August 01, 2009

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Spectroscopy presents a comprehensive index of our FT-IR articles since 2004.

Vol 24 No 8 Spectroscopy August 2009 Regular Issue PDF

August 01, 2009

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Click the title above to open the Spectroscopy August 2009 regular issue, Vol 24 No 8, in an interactive PDF format.