New York Society for Applied Spectroscopy Announces Speakers for Fall 2018 Meetings
The New York and New Jersey section of the Society for Applied Spectroscopy (NYSAS) has announced the speakers and schedule for its fall 2018 meetings.
The New York and New Jersey section of the Society for Applied Spectroscopy (NYSAS) has announced the speakers and schedule for its fall 2018 meetings.
September 13, 2018: John Wasylyk of Bristol-Myers Squibb, on the Development of 'Fit for Purpose' Near Infrared Spectroscopic Methods for Lyophilized Biopharmaceuticals to be held at Horiba Scientific, 20 Knightsbridge Road, Piscataway, New Jersey, from 5:15 to 8:00 pm.
October 2018: Christine Sayhoun, of Marc Pierce’s group at Rutgers University, on “A Comparison of Structural and Functional Optical Coherence Tomography Systems for Assessment of Hard Dental Tissues.”
November 2018: Eastern Analytical Symposium (EAS) Gold Medal Award Program honoring Professor Igor Lednev of the University of Albany, sponsored by the New York and New Jersey SAS and EAS (held in conjunction with EAS).
December 5, 2018:Curtis Marcott of Light Light Soluctions on “Perspectives on the Future of IR Spectroscopy: IR Beyond the Diffraction Limit at Submicron and Nanoscale Spatial Resolutions via Photothermal Techniques.” Marcott’s talk is part of a special speaker tour organized by the national SAS organization.
Due to the required lead times for publication, the New York SAS is providing this announcement before all of the details of the meetings have been arranged. The meeting details will be posted on the NYSAS website: www.nysas.org as soon as they become available. Please consult the website regularly for details, possible changes, and information about future meetings. Those planning to attend a meeting are requested to email the NYSAS secretary debperu@outlook.com beforehand so arrangements can be made for the expected number of people. Attendee names will be added to the e-mail list for future meeting announcements unless a request to opt out is provided.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
