A novel approach in Raman spectroscopy enables bulk material analysis without the need for specialized equipment. Enhanced Raman reflection can be integrated into current processes using available instrumentation, enabling real-time process measurement and control.
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
June 13th 2024This Agilent application note discusses the Cary 7000 UMS, a system for mapping coated wafers using UV-Vis spectral reflection and transmission measurements. It introduces a new autosampler for automated, high-resolution mapping of large samples and demonstrates its utility with a zinc tin oxide layer on a sapphire substrate.