Why, when, and how to maintain ICP-MS interface cones, in addition to the importance of cone conditioning is discussed, along with the benefits of Platinum tipped cones.
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
June 13th 2024This Agilent application note discusses the Cary 7000 UMS, a system for mapping coated wafers using UV-Vis spectral reflection and transmission measurements. It introduces a new autosampler for automated, high-resolution mapping of large samples and demonstrates its utility with a zinc tin oxide layer on a sapphire substrate.