Photoluminescence (PL) lifetime measurements in NIR are the key parameters in assessing the optical efficiency of devices involving lanthanides, as well as in quality control during their manufacturing.
Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
June 13th 2024This Agilent application note discusses the Cary 7000 UMS, a system for mapping coated wafers using UV-Vis spectral reflection and transmission measurements. It introduces a new autosampler for automated, high-resolution mapping of large samples and demonstrates its utility with a zinc tin oxide layer on a sapphire substrate.