Spectroscopy’s Editorial Advisory Board is a group of distinguished individuals assembled to help the publication fulfill its editorial mission to promote the effective use of spectroscopic technology as a practical research and measurement tool. With recognized expertise in a wide range of technique and application areas, board members perform a range of functions, such as reviewing manuscripts, suggesting authors and topics for coverage, and providing the editor with general direction and feedback. We are indebted to these scientists for their contributions to the publication and to the spectroscopy community as a whole.
Fran Adar – Horiba Scientific
Russ Algar – University of British Columbia
L. Robert Baker – The Ohio State University
Matthew J. Baker – University of Strathclyde
Ramon M. Barnes – University of Massachusetts
Matthieu Baudelet – University of Central Florida
Rohit Bhargava – University of Illinois at Urbana-Champaign
Karl S. Booksh – University of Delaware
Michael S. Bradley – Thermo Fisher Scientific
Deborah Bradshaw – Consultant
George Chan – Lawrence Berkeley National Laboratory
John Coates – Coates Consulting LLC
John Cottle – University of California Santa Barbara
Paul J. Gemperline – East Carolina University
Dominic Hare – University of Melbourne
David Lankin – University of Illinois at Chicago, College of Pharmacy
Barbara S. Larsen – Larsen Scientific Consulting
Barry K. Lavine – Oklahoma State University
Igor K. Lednev – University at Albany, State University of New York
Bernhard Lendl – Vienna University of Technology (TU Wien)
Ian R. Lewis – Kaiser Optical Systems
Howard Mark – Mark Electronics
R.D. McDowall – McDowall Consulting
Gary McGeorge – Bristol-Myers Squibb
Francis M. Mirabella Jr. – Mirabella Practical Consulting Solutions, Inc.
Ellen V. Miseo – Consultant
Michael L. Myrick – University of South Carolina
John W. Olesik – The Ohio State University
Yukihiro Ozaki – Kwansei Gakuin University
Steven Ray – State University of New York at Buffalo
Andreas Riedo – University of Bern
Jim Rydzak – Specere Consulting
Jacob T. Shelley – Rensselaer Polytechnic Institute
Barry Wise – Eigenvector Research Inc.
Jerome Workman Jr. – Biotechnology Business Associates
Lu Yang – National Research Council Canada
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.