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Overcoming the Challenges Associated with the Direct Analysis of Trace Metals in Seawater Using ICP-MS
Special Issues - November 1, 2011
The direct analysis of seawater by inductively coupled plasma–mass spectrometry (ICP-MS) is notoriously difficult because of the high matrix content of the sample that leads to both spectroscopic (for example, polyatomic interferences) and nonspectroscopic interferences (for example, signal suppression). Additionally, the low target concentration levels demand a noncontaminating, robust sample introduction technique. The latest ICP-MS techniques provide high-throughput methods that are able to process large numbers of samples presented for analysis.
The Determination of 226Ra in Nontypical Soil Samples by ICP-MS
Special Issues - November 1, 2011
This article describes a way to measure 226Ra using inductively coupled plasma–mass spectrometry (ICP-MS) rather than the conventional method of gamma spectroscopy, taking into account an undocumented interference (207Pb19F) that is caused by the requirement to use hydrofluoric acid during sample preparation. The unusually high Pb levels observed in a number of soil samples caused significant interferences at the very low concentrations of 226Ra that were measured. The expected 208Pb18O interference was insignificant under optimized instrument conditions.
Validating ICP-MS for the Analysis of Elemental Impurities According to Draft USP General Chapters <232> and <233>
Special Issues - November 1, 2011
The current United States Pharmacopeia (USP) General Chapter <231> "heavy metals limit test" will be replaced by new instrumental methods, USP <232> (Limits) and <233> (Procedures), in 2013.
Raman Thermometry of Microdevices: Comparing Methods to Minimize Error
Spectroscopy - November 1, 2011
Temperature measurements can be made using spectral features such as the position, linewidth, and intensity of the Raman signal associated with specific optical phonon modes. Each of these spectral characteristics offers particular advantages, depending on the type of device and operational considerations.




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