Characterization of Functionalized Nanoparticles Using Ambient Ionization Mass Spectrometry
This is the second of a three-part podcast series focused on nanomaterials characterization and the recent advancement in nano metrology and analytical methods. This series addresses three innovative and complementary analytical techniques that cover various measurements needed in the field on nanotechnology and nanomaterials characterization.
This is the second of a three-part podcast series focused on nanomaterials characterization and the recent advancement in nano metrology and analytical methods. This series addresses three innovative and complementary analytical techniques that cover various measurements needed in the field on nanotechnology and nanomaterials characterization. This second podcast will focus on the use of direct sample analysis (DSA), an ambient ionization technique, combined with time of flight (TOF) mass spectrometry, a novel technique that allows the rapid characterization of organic ligands residing on the surfaces of nanomaterials.
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Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
