Reflectance Measurements of Materials Used in the Solar Industry

XperRAM S combined with a phase shifting interferometer is capable of analyzing the surface structure of nanomaterials such as graphene, 2D materials, and TMD.

By adding a FLIM module to the inVia Raman microscope, you can directly correlate Raman and fluorescence lifetime images with ease.

This work describes Raman and IR spectroscopies as a viable means of comparing CO2 concentrations.

In this application note, we use a compact, high-resolution spectrometer to investigate the reflectance properties of graphite samples in powder form.

In this application note, we evaluate the effectiveness of a modular spectrometer for measuring the absorbance of optical filters and potassium dichromate standards.

Its high SNR and excellent thermal stability make the Ocean SR6 spectrometer desirable for applications including DNA analysis and protein concentration measurements.