ACD/Labs and Nanalysis Scientific Enter into Collaborative Arrangement
ACD/Labs (Toronto, Canada) and Nanalysis Scientific Corporation (Calgary, Albereta, Canada) have entered into a collaborative arrangement that will supply purchasers of Nanalysis 60 and 100 MHz benchtop NMR spectrometer with ACD/Spectrus Processor software for data processing and analysis.
ACD/Labs (Toronto, Canada) and Nanalysis Scientific Corporation (Calgary, Albereta, Canada) have entered into a collaborative arrangement that will supply purchasers of Nanalysis 60 and 100 MHz benchtop NMR spectrometer with ACD/Spectrus Processor software for data processing and analysis. The announcement was made at the 61st Experimental Nuclear Magnetic Resonance Conference (ENC), which took place in March, in Baltimore, Maryland.
The terms of the agreement allow Nanalysis to bundle a one-year subscription of ACD/Spectrus Processor at no cost to academics, and for a small fee to industry. ACD/Labs’ industry-standard software that predicts spectra from structure (ACD/Labs NMR Predictors) and its advanced processing, interpretation, and databasing application (ACD/NMR Workbook Suite) will also be available to Nanalysis customers.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
