Application Notes

Ultrapure Water to Assess Toxic Elements

March 20, 2023

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This study demonstrates the suitability of freshly prepared ultrapure water for ICP-MS trace element analyses in environmental laboratories

Characterization of Nanoparticle Element Oxide Slurries

March 16, 2023

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This study outlines the quantitation and characterization of element oxide nanoparticles (Al2O3, and CeO2) in nanoelectronics and semiconductors.

Thermal Analysis Applications for Semiconductor Packaging

March 16, 2023

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Semiconductor manufacturing requires failure analysis and QC processes. Learn how Thermal Analyses applications can lead to cost savings in R&D and QA/QC.

ICP-MS Analysis of Soil and Water by EPA Method 6020B

March 16, 2023

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This work demonstrates that the NexION® 2000 ICP-MS meets the needs of analytical laboratories involved in the analysis of waters and soils.

Analyzing Iron Nanoparticles in Organic Solvents

March 16, 2023

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This work demonstrates the ability of the NexION® SP-ICP-MS to detect iron-containing nanoparticles in organic solvents using Reaction mode.

Automated Analysis of Semiconductor-Grade Hydrofluoric Acid

March 16, 2023

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This work presents the automated analysis of HNO3 using the NexION® 5000 ICP-MS working with the ESI prepFAST S ultraclean sample introduction system.

Analysis of Nanoparticles in Semiconductor Chemicals

March 16, 2023

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This work describes a method for the routine ultratrace-level quantification of nanoparticle impurities in TMAH using the NexION® 5000 Multi-Quadrupole ICP-MS.

Water Analysis Following EPA Method 200.7 by ICP-OES

March 16, 2023

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This work shows the ability of the Avio® 560 Max ICP-OES to perform rapid analysis – 60 seconds sample to sample – of wastewater in accordance with EPA Method 200.7.

Analysis of Trace Elements in Open-Ocean Seawater

March 16, 2023

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This work presents a method for the direct analysis of trace elements in seawater samples using the NexION 5000 ICP-MS.

Ultra-Trace Quantification of Non-Metals

March 16, 2023

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This work demonstrates the ability of the NexION® 5000 ICP-MS to determine DLs and BECs of typical non-metal contaminants in sulfuric acid solutions.