Founded in 1986, Spectroscopy provides peer-reviewed articles, trusted advice from expert columnists, and the latest breaking developments to facilitate the advance of analytical spectroscopy and its use as an essential tool across a variety of applications and fields.
Founded in 1986, Spectroscopy provides peer-reviewed articles, trusted advice from expert columnists, and the latest breaking developments to facilitate the advance of analytical spectroscopy and its use as an essential tool across a variety of applications and fields.
Through our monthly print publication, website, newsletters, ebooks, webcasts, interviews, and special issues, Spectroscopy provides academicians, laboratory scientists and managers, technicians, and those using analytical spectroscopy outside the laboratory with news, information about technical advances, best practices, and sage advice for improved proficiency and competitive advantage.
Spectroscopy has a circulation of more than 25,000 audited readers and a broad web reach through our online publishing. Spectroscopy is indexed in the Web of Science, Journal Citation Reports, and EBSCOhost. Articles in Spectroscopy reach a large and diverse scientific readership.
Please direct all press releases to Caroline Hroncich, associate editorial director, at chroncich@mjhlifesciences.com.
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Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.