Application Notes: Atomic Spectroscopy

Easily measure mercury in fish with no digestion. DMA-80 evo reduces cost, waste, and hands-on time while delivering EPA 7473 compliant results.

ICP-MS offers ultra-sensitive metal impurities analyses in LiBs cathodes, with the NexION® 1100 ICP-MS helping meet stricter quality standards for better battery performance.

Additives are often utilized to enhance Li-ion battery performance. The Avio® 550 Max ICP-OES provides a suitable test method for additives to Li-ion battery cathodes.

SiBs are a safer, cheaper, greener alternative to LiBs. PerkinElmer's Avio® 550 Max ICP-OES ensures precise, efficient analysis of SiBs cathode materials.

Advanced laboratory solutions enable the development of safer, lighter solid-state batteries, driving EV innovation and supporting the renewable energy shift.

This white paper discusses the key trends, challenges, and potential of emerging battery technologies like solid-state, Li-ion, Na-ion, and recycling advancements.

Solid electrolytes boost Li-ion battery safety and performance. PerkinElmer's Avio® 220 Max ICP-OES ensures precise impurity control below 0.1% for optimal results.

EV demand is growing, boosting Li-ion battery use. The Avio® 550 Max ICP-OES provides accurate, repeatable determinations of the molar ratio of Li to sum of metals in NCMA.

TMA and STA technologies allow in-situ monitoring of the sintering process of solid electrolyte powders, optimizing solid-state battery performance.

Compositional Depth Profile (CDP) using the LECO GDS950 rapidly provides analysis of various galvanized coatings on steel.

ICP-MS is the top choice for trace element analysis in bodily fluids. The NexION® 5000 ensures fast, precise detection in serum with simple sample prep.

USP and ICH Q3D set strict limits for elemental impurities in drugs. The NexION® 1100 ICP-MS ensures accurate, interference-free analysis of pharmaceutical products.

Controlling metal impurities in CO is vital for semiconductor fabrication. The NexION® 2200 ICP-MS with gas direct injection (GDI) enables faster, more sensitive analysis.

Trace impurities in tungsten hexacarbonyl must be measured precisely. The NexION® 1100 ICP-MS eliminates interferences, enabling accurate multi-element analysis.

ICP-MS is the go-to for detecting trace elements in bodily fluids. The NexION® 5000 makes urine analysis easy and precise with simple dilution—no digestion needed!

Ultra-pure NMP is essential in semiconductor fabrication. The NexION® 2200 ICP-MS enables precise, interference-free trace metal analysis, ensuring high-purity standards.

Si isotope analysis reveals insights into geological and biological processes. The NexION® 5000 ICP-MS offers high sensitivity, accuracy, and stability for precise ratio measurements.

Ultra-high-purity HCl is crucial in semicon wafer cleaning. The NexION® 2200 ICP-MS accurately quantifies ultra-trace impurities, minimizing interferences and sample prep.

In BioTech R&D, overcoming data fragmentation is crucial as it hinders innovation, leads to redundant efforts, and wastes resources.

See how the NexION® 5000 multi-quad ICP-MS offers exceptional performance and interference removal for trace metallic impurities in ultra-pure N-methyl-2-pyrrolidone.

Camston Wrather is transforming waste disposal with sustainable resource recovery from PCBs. Partnering with PerkinElmer, they’ve advanced eco-friendly solutions.

For the analysis of semiconductor-grade solvents, see how the NexION® 2200 ICP-MS accurately quantifies ppt-level impurities by reducing polyatomic interferences.

In semiconductor fabrication, controlling impurities is crucial. This work describes metallic nanoparticle analysis in sulfuric acid using the NexION® 5000 SP-ICP-MS.

Explore a method for ultratrace-level quantification of nanoparticle impurities in semiconductor-grade TMAH using NexION® 5000 ICP-MS for improved yield and performance.

This work demonstrates the ability of the NexION® 2200 ICP-MS to reliably and effectively quantify ultra-trace impurities at the ng/L level in concentrated HCl.

For improved semiconductor gas analysis, discover how Gas Direct Injection-ICP-MS simplifies sample prep, replacing impingers with direct analysis.

For non-metallic impurity analysis in dilute nitric acid, the NexION® 5000 ICP-MS uses a mixed-mode method to achieve low-ppt detection, overcoming spectral interferences.

Analysis of drinking water in compliance with the U.S. EPA Method 200.8, Revision 5.4 using the Thermo Scientific iCAP MSX ICP-MS

Comprehensive analysis of water samples in alignment with EN ISO Method 17294 using ICP-MS

Robust analysis of a variety of water, wastewater, and soil samples according to the requirements of U.S. EPA Method 6020B.