Total Reflection X-Ray Fluorescence Spectrometry for Metals and Nanoparticle Analysis
June 08, 2016
Total reflection x-ray fluorescence (TXRF) spectrometry is an energy-dispersive x-ray technique that is used for elemental and chemical analysis, and is especially suitable for small-sample analyses. Ursula Fittschen, an assistant professor at Washington State University, is working on elemental microscopy and micro analysis. She has been using TXRF to analyze stainless steel metal release, and also airborne silver nanoparticles (NPs) from fabrics. Here, she describes the advantages and challenges of this technique.