Bruker Optics a division of Bruker Corporation
Company Description
Bruker was founded in 1960 with nuclear magnetic resonance (NMR) products. Bruker launched its first ever FT-IR spectrometer, the IFS series, and entered the field of vibrational spectroscopy in 1974. The "Genzel" interferometer and many other unique options available on IFS series instantly set the standard for excellence in FT-IR spectroscopy. Since then, Bruker's vibrational spectroscopy product line has been continuously expanding with instruments suitable for both analytical and research applications.
Bruker Optics is a part of the Bruker Corporation and offers FT-IR, FT-NIR, Raman, TeraHertz spectrometers and imaging spectrometers for various markets and applications.
Chief Spectroscopic Techniques Supported
- FT-IR spectroscopy and microscopy
- FT-near infrared spectroscopy (FT-NIR)
- Raman spectroscopy and microscopy
- Terahertz spectroscopy and imaging
Markets Served
Pharmaceutical, Food and Agriculture, Chemical, Environmental, BioPharma, Material Science, Life Science, Quality Control, and Homeland Defense.
Major Products/Services
- FT-IR spectrometers and microscopes
- FT-NIR spectrometers
- Raman spectrometers and microscopes
- Vacuum FIR/THz spectrometers
- Remote sensing systems
Facility
Bruker Optics R&D and manufacturing centers are in Ettlingen, Germany, with supporting technical centers and offices throughout Europe, North and South America, and Asia.
Bruker Optics, a division of Bruker Corporation
40 Manning Road,
Billerica, MA 01821
TELEPHONE
(888) 427-8537
FAX
(978) 663-9177
WEB SITE
NUMBER OF EMPLOYEES
6000 worldwide for Bruker Corporation
YEAR FOUNDED
1960
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
