Characterization of Functionalized Nanoparticles Using Ambient Ionization Mass Spectrometry
This is the second of a three-part podcast series focused on nanomaterials characterization and the recent advancement in nano metrology and analytical methods. This series addresses three innovative and complementary analytical techniques that cover various measurements needed in the field on nanotechnology and nanomaterials characterization.
This is the second of a three-part podcast series focused on nanomaterials characterization and the recent advancement in nano metrology and analytical methods. This series addresses three innovative and complementary analytical techniques that cover various measurements needed in the field on nanotechnology and nanomaterials characterization. This second podcast will focus on the use of direct sample analysis (DSA), an ambient ionization technique, combined with time of flight (TOF) mass spectrometry, a novel technique that allows the rapid characterization of organic ligands residing on the surfaces of nanomaterials.
To view the associated webcast click here.
Best of the Week: SciX Award Interviews, Tip-Enhanced Raman Scattering
June 13th 2025Top articles published this week include an interview about aromatic–metal interactions, a tutorial article about the recent advancements in tip-enhanced Raman spectroscopy (TERS), and a news article about using shortwave and near-infrared (SWIR/NIR) spectral imaging in cultural heritage applications.
Hyperspectral Imaging for Walnut Quality Assessment and Shelf-Life Classification
June 12th 2025Researchers from Hebei University and Hebei University of Engineering have developed a hyperspectral imaging method combined with data fusion and machine learning to accurately and non-destructively assess walnut quality and classify storage periods.
