This is the second of a three-part podcast series focused on nanomaterials characterization and the recent advancement in nano metrology and analytical methods. This series addresses three innovative and complementary analytical techniques that cover various measurements needed in the field on nanotechnology and nanomaterials characterization. This second podcast will focus on the use of direct sample analysis (DSA), an ambient ionization technique, combined with time of flight (TOF) mass spectrometry, a novel technique that allows the rapid characterization of organic ligands residing on the surfaces of nanomaterials.

To view the associated webcast click here.