DXC 2006: The World's Leading Forum for X-Ray Materials Analysis

July 1, 2006
Spectroscopy

Volume 21, Issue 7

Spectroscopy previews all of the events and happenings at the 55th Annual Denver X-Ray Conference, to be held August 7-11 in Denver, Colorado.

The 55th Annual Denver X-Ray Conference on Applications of X-Ray Analysis, sponsored by the International Centre for Diffraction Data (ICDD), will be held from August 7 to August 11, 2006, at the Denver Marriott Tech Center Hotel in Denver, Colorado. In addition to the conference events, the beautiful Mile High City offers something for everyone: sporting events; great dining; a collection of museums, galleries, and shopping; and more.

The Denver X-Ray Conference (DXC) is the world's leading forum for scientists in the field of X-ray materials analysis. The conference provides sessions on training, education, and applications that will appeal to both newcomers in the field and those with many years of experience. Another exciting part of the DXC is the presence of leading manufacturers of X-ray equipment, who will be exhibiting their latest devices and answering technical questions.

Members of the Denver X-Ray Conference Organizing Committee help to ensure that the technical program remains commercial free and that the sessions and workshops address the needs of the attendees. Workshops are run by experts in X-ray diffraction (XRD) and X-ray fluorescence (XRF), who provide training on the many practical applications of these techniques and will be available to answer attendees' questions.

Workshops

Here is a brief outline of the workshops being offered at this year's DXC:

XRD

Specimen Preparation XRD

Rietveld Applications I—Beginner

Rietveld Applications II—Advanced

High Resolution XRD

Basic Crystallography

New Generation of XRD Databases—Capabilities and Applications I & II

XRF

Specimen Preparation XRF I & II

Trace Element Analysis

Basic XRF

Quantitative Analysis I & II

EDXRF

XRD & XRF

Microbeam X-ray Characterization I & II

Plenary Session

The Plenary Session on Wednesday, August 9, is titled "Medical Applications of X-ray Analysis." The following are the invited papers to be presented during this session:

MEDICAL APPLICATIONS OF X-RAY FLUORESCENCE: A STATUS REPORT RELATED TO TRACE ELEMENT RESEARCH

J. Börjesson, Department of Diagnostic Radiology, County Hospital (Halmstad, Sweden)

S. Mattsson, Department of Radiation Physics, Malmö University Hospital (Malmö, Sweden)

IN VIVO MEASUREMENT OF TOXIC ELEMENTS USING X-RAY FLUORESCENCE ANALYSIS

F.E. McNeill, D.R. Chettle, L. Nie, M. Popovic, R.C.N. Studinski, McMaster University (Hamilton, Ontario, Canada)

J.M. O'Meara, University of Guelph (Guelph, Ontario, Canada)

A REVIEW: XRF ANALYSIS OF Pb IN BONE

P. Wobrauschek, Atominstitut, Vienna University of Technology (Vienna, Austria)

CANCER DIAGNOSIS USING SAXS IMAGING

K.D. Rogers, S. Wilkinson, A. Round, Cranfield University (Wiltshire, UK)

C.J. Hall, Daresbury Laboratory (Cheshire, UK)

Presentation of Awards

The 2006 Birks Award will be presented to Peter Wobrauschek, Atominstitut, Vienna University of Technology (Vienna, Austria). It will be presented by M.A. Zaitz, IBM (Hopewell Junction, New York).

This year's Jerome B. Cohen Student Award will be announced at the plenary session and is scheduled to be presented by I.C. Noyan, Columbia University (New York, New York).

Finally, the 2006 Hanawalt Award will be presented to Peter Wallace, Dos Arroyos Enterprises (Oro Valley, Arizona), by J.A. Kaduk, Innovene USA LLC (Naperville, Illinois).

Oral Sessions

XRD & XRF Topics

New Developments in XRD & XRF Instrumentation

In-Situ Characterization

Thin Films

X-ray Optics

Detectors & Sources

Environmental & Archaeological Applications

XRD Topics

Structure Solution & Refinement

Applications of High-Energy X-rays

Industrial Applications of XRD

Stress Analysis

XRF Topics

Quantitative XRF

New Developments in Instrumentation and Industrial Applications of XRF

Trace Analysis

Fusion Applications

Posters

XRD Poster Session

Instrumentation

A New Tensile Stage for In-Situ X-ray Scattering Experiments Combined With Mechanical Tests

Automatic Sample Height Correction for Non-Ambient Experiments

Usage of an Advanced Fullpat Method To Quantify Amorphous Material

Performance and Industrial Studies at the New Neutron Residual Stress Mapping Facility

First Experiment of a Structural Studies Beamline BL15 of a Compact Synchrotron Light Source (SAGA-LS) Newly Constructed With High Cost Performance

DHS1100—A New High Temperature Attachment for Multipurpose 4-Circle X-ray Goniometers

Microdiffraction With a New Intensified CCD Camera and Focusing Monocapillary Optic on a Conventional Powder Diffractometer

Transmission X-ray Powder Diffraction With a Confocal Graded D-Spacing Mirror Optic—A New Technique for Deposited Thin Films and Capillary Samples

Analysis of Very Small Samples With a Pseudoparallel Geometry Diffraction System

Grazing Incidence

Analysis of Low Mass Absorption Materials Using Glancing Incidence X-ray Diffraction

Anomalous Scattering From Single Crystal Substrate

An Analysis of the Stress Distribution Based on Measurements Carried Out Using X-ray Incidence Method

Stress

X-ray Diffraction Measurement for Characterization of Energetic Materials

X-ray Characterization of WC Surface Coatings

The Comparative Investigations of Surface Residual Stresses in Steel After Static and Cyclic Deformation

"Galaxy XRD"—Inspection of Single Crystal Turbine Blades

Analysis and Evaluation on Residual Stress of Fine Grain Steel Using X-ray

Shot Peening Efficiency for Fine Grain Steel

Residual Stress State of Hydroxyapatite Graded Coating on Ceramic Substrate

Rapid Determination of Stress Factors and Residual Stresses in Anisotropic Thin Films

Texture Changes in Cyclically Deformed Cellulosics Characterized by In-Situ Synchrotron Diffraction Coupled With Tensile Tests

Stress Mitigation of X-ray Beamline Monochromators Using Topography Test Unit

Determination of Poisson's Ratio and Young's Modulus of Nitride Thin Films

In-Situ

High Temperature X-ray Diffraction Analysis of Defense Waste Processing Facility Glass Frits

Size Effect in Metallic Thin Films Characterized by Low-Temperature X-ray Diffraction

Temperature Accuracy in High Temperature XRD—Influencing Factors and Calibration

Neutron and Synchrotron Structure Evaluation of Li3N During Hydriding and Dehydriding

High Temperature Diffraction to Develop Solid Oxide Fuel Cell Sealing Glasses

Miscellaneous

A Method for Cell Gap Measurement of Reflective Twisted Nematic Liquid Crystal Display

An EXAFS Study of Photographic Development in Photothermographic Films

Correcting for Microabsorption—Brindley Revisited

Radiation Damage in Powder Samples Prepared With Binder

Characterization and Optical Properties of CdS:Cu Nanocrystals Prepared by Chemical Synthesis

Influence of Samarium on the Crystal Structure and Microstructure of Photolumescent SrTiO3

Rietveld Analysis: Choosing X-ray Powder Diffraction Data Obtained From Parallel and Focusing Beam Geometry

Interactive Data Language Visualizations and Calculations From Full Datasets

Unit Cell Expansion in ErT2 Films

Capturing and Shaping X-rays With Free-Form Multilayer Optics

Quantitative XRD Analysis for Process Control at Aluminum Smelters

XRF Poster Session

Applications

Non-Destructive Analysis of a Painting, National Treasure in Japan

X-ray Phase-Contrast Tomography of Malaria Transmitting Mosquitoes for Morphology Studies

Determination of Low Z Elements With TXRF in Biofilms Directly Cultivated on Quartz Carrier Plates

Lead in Human Cartilage: Imaging and Speciation by Micro-XRF and Micro-XANES

Carbon Nanotube Elemental Char-acterization Using Micro X-ray Fluorescence

Arsenic Speciation in Cucumber (Cucumis sativus L.) Xylem Sap by K-Edge TXRF-XANES

Non-Destructive EDXRF Analysis of Archaeological Samples

Instrumentation

Design of a Borehole XRF Spectrometer for the Mars Regolith

Portable XRF System Including Light Element Analysis With Polycapillary Optics for the Investigation of Art Objects

Benchtop WDXRF Ultra-Low Sulfur Analyser for Fuel Oil

Application of Total Reflection Mirrors for Radiation Gathering Improvement of X-ray Planar Waveguide-Resonator

Analytical Application of Multilayer X-ray Optics

Quantitative

The Ratio of Lines Intensities as an Analytical Parameter in XRF

Estimating the Hydrocarbon or Oxide Fraction of Bulk Samples Using Scattered Radiation

Exhibits

In addition to attending the programs being presented at the DXC, conference participants will have the opportunity to visit the Columbine Center on the ground floor of the hotel to see the exhibits being presented by some of the leading manufacturers in the field. A diagram of the exhibit locations will be available in the Book of Abstracts and on the DXC web page.

Exhibit Hours:

Monday 10:00 a.m.–5:00 p.m.

Tuesday 10:00 a.m.–5:00 p.m.

Wednesday 10:00 a.m.–5:00 p.m.

Thursday 10:00 a.m.–2:00 p.m.

For more information and to register on-line, see the Denver X-ray Conference web page at http://www.dxcicdd.com. The information contained in the program is current as of the printing date.