John A. Reffner has been named the recipient of the 2015 Gold Medal Award from the New York section of the Society for Applied Spectroscopy. The award was presented to him at the 2015 Eastern Analytical Symposium in Somerset, New Jersey, on November 16.
John A. Reffner has been named the recipient of the 2015 Gold Medal Award from the New York section of the Society for Applied Spectroscopy. The award was presented to him at the 2015 Eastern Analytical Symposium in Somerset, New Jersey, on November 16.
Reffner is currently a professor of forensic science at John Jay College in New York, New York, which is part of the City University of New York (CUNY) system. His scientific interests are focused on uniting microscopy with spectroscopy and applying novel technologies to advancing materials and forensic science.
Jay pioneered the development of infrared microspectrometers, accessories, and innovative applications infrared microprobe technology. Reffner’s scientific accomplishments are recognized by his receiving numerous awards, including the American Academy of Forensic Sciences’ Paul L. Kirk Award (2004), the New York Microscopical Society’s Abbe Memorial Award (2002), the Georgia Microscopical Society’s Honorary Achievement Award (2002), the Coblentz Society’s Williams-Wright Award (2000), and the Illinois State Microscopical Society’s Emile M. Chamot Award (1993). In 2011, Dr. Reffner was named a Fellow of the Society of Applied Spectroscopy.
Reffner has authored more than 80 papers and four book chapters, and holds 10 patents. He served as a consultant to the Connecticut State Police for over 25 years, and testified as an expert witness in criminal, civil, and patent litigations.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.