Launch of Cannabis Science and Technology Magazine
Our new sister publication, Cannabis Science and Technology (CST), launched in March 2018.
Our new sister publication, Cannabis Science and Technology (CST), launched in March 2018. In alliance with the Cannabis Science Conference, this new professional journal and website will focus on educating the legal cannabis industry about the science and technology of analytical testing and quality control, including topics such as
- Sample preparation techniques for analytical testing
- Development of analytical methods for potency testing
- Identifying contaminants such as pesticides, residual solvents, heavy metals, and mycotoxins
- Quality control for cannabis, extraction, and processing
- Laboratory best practices and certification
- Testing standardization
- Regulations related to quality control
The first issue features content ranging from quality assurance, laboratory accreditation, analytical tools to analyze edibles, metals analysis, extraction processes, and more. To read the full issue, please visit www.cannabissciencetech.com/journal/cannabis-science-and-technology-vol-1-no-1 or download the digital edition.
If you would like to submit an article to Cannabis Science and Technology, contact Meg L’Heureux, Editor-in-Chief at Meg.Lheureux@ubm.com.
For subscription information, please visit http://www.cannabissciencetech.com/subscribe
AI and Satellite Spectroscopy Team Up to Monitor Urban River Pollution in China
April 30th 2025A study from Chinese researchers demonstrates how combining satellite imagery, land use data, and machine learning can improve pollution monitoring in fast-changing urban rivers. The study focuses on non-optically active pollutants in the Weihe River Basin and showcases promising results for remote, data-driven water quality assessments.
New Optical Modeling Method Advances Thin Film Analysis Using Spectroscopic Ellipsometry
April 30th 2025Researchers at Zhejiang University have developed an advanced optical modeling approach using spectroscopic ellipsometry, significantly enhancing the non-destructive analysis of amorphous silicon oxide thin films.
