EDAX Inc. has introduced the Orbis micro-XRF inorganic elemental analyzer system, setting a new standard in analytical flexibility.
EDAX Inc. has introduced the Orbis micro-XRF inorganic elemental analyzer system, setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret for coaxial sample view and X-ray analysis. Primary beam filters can be used with X-ray optics for tailored micro-spot analyses. Orbis micro-XRF measurements are non-destructive, require minimal sample preparation and offer improved sensitivity over SEM/EDS. Applications include forensics, materials identification/compositional analysis, failure analysis, RoHS/WEEE, non-destructive testing, elemental imaging and more. EDAX, Inc., Mahwah, NJ; Visit EDAX Inc. online
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.