November 1, 2011

Microwave plasma–atomic emission spectrometer

Microwave plasma–atomic emission spectrometer

The model 4100 microwave plasma–atomic emission spectrometer from Agilent is designed to run on air. According to the company, the device uses a nitrogen-based plasma that runs on air and does not require external cylinder connections or gases. Agilent Technologies, Santa Clara, CA;

Spectrometer application note

Teledyne's application note on the analysis of trace elements in tungsten carbide using the company's Prodigy DC Arc spectrometer is now available at The publication discusses the ability of the instrument to analyze tungsten carbide samples in solid form. Teledyne Leeman Labs, Hudson, NH;

Solar analysis system

The RaySphere spectroscopic system from Ocean Optics is designed for irradiance measurements in the 380–1700 nm range. According to the company, the system includes two thermoelectrically cooled detectors. Applications include absolute irradiance measurements of solar simulators and other radiant sources. Ocean Optics, Dunedin, FL;

Glow discharge spectrometry application information

LECO's application notes for glow discharge-atomic emission spectrometry describe the analysis of titanium alloy, tin-based lead-free solder, and boron in low-alloy steel. The notes feature the company's GDS500A instrument, which uses the glow discharge method to uniformly sputter material from the sample's surface. LECO Corporation, St. Joseph, MI;

FT-NIR analyzers

Thermo Fisher Scientific's precalibrated FT-NIR analyzers are designed for feed and ingredient analysis in agriculture, and flour and milling analysis in the food processing industry. The systems consist of the Antaris II FT-NIR analyzer with Integrating Sphere Module with a 5- or 12-cm sample cup spinner accessory, RESULT and TQ Analyst software packages, and either the INGOT Level 4 Flour and Milling or Feed and Ingredient calibration software. Thermo Fisher Scientific, Inc., Madison, WI;

XRF kit

Amptek's XRF Kit is designed to help users begin performing elemental analysis via X-ray fluorescence. According to the company, the kit includes the company's X-123 complete spectrometer with an SDD or Si-PIN detector; a mini-X USB controlled X-ray tube; XRF-FP QA software; a mounting plate; and a test sample. Amptek Inc., Bedford, MA;

Si-PIN detector

Moxtek's XPIN detector includes a silicon PIN diode, a multilayer collimator, and a thin DuraBeryllium window. According to the company, the detector's preamp provides a low-noise signal output to an analog or digital pulse shaping amplifier. The detector reportedly can be used for benchtop and portable applications for which an integrated temperature controller is not required. Moxtek, Orem, UT;

Optical components

Optical components from CVI Melles Griot are designed for ultrafast spectroscopy. The company's mirrors, beam splitters, polarizers, and prisms for Ti:sapphire or fiber lasers can be used in time-domain measurements, spectroscopy, imaging, sensing, and biomedical applications. CVI Melles Griot, Albuquerque, NM;

UV–vis spectrophotometers

Compact UV–vis spectrophotometers from Shimadzu are designed to reduce stray light during routine analysis and research applications. According to the company, the model UV-2600 spectrometer has a measurement wavelength range to 1400 nm, and the model UV-2700 achieves stray light of 0.00005% at 220 nm. Shimadzu Scientific Instruments Inc., Columbia, MD;

InGaAs detector array

Andor's iDus InGaAs detector array series provides a platform for spectroscopy applications up to 2.2 µm. According to the company, the TE-cooled, in-vacuum sensors reach cooling temperatures of -90 °C. Andor Technology, Belfast, Northern Ireland;


The ShakIR ball mill from PIKE Technologies is designed to grind and mix IR-transparent diluents for diffuse reflectance measurements. According to the company, the accessory features electronic control and a protective shield for safety during use. PIKE Technologies, Madison, WI;

Raman analyzer

The EZRaman-N analyzer from Enwave Optronics is designed for fast carbon nanotube characterization. According to the company, the 100–3300 cm-1 spectral range covers full carbon nanotube bands of interest from the radial breathing mode to the G'-band. Enwave Optronics, Inc., Irvine, CA;

Inorganic certified reference materials

Inorganic certified reference materials from SPEX CertiPrep are designed for use with US EPA and ASTM methods. The products can be used for compliance monitoring of drinking water samples and for the analysis of ground and surface water. Common methods include US EPA SW-846, method 1310, US EPA 200.7, and US EPA 200.8. According to the company, each standard comes with a comprehensive, detailed certificate of analysis, and MSDS. SPEX CertiPrep, Metuchen, NJ;

Imaging ATR accessory

Thermo Fisher Scientific's imaging ATR accessory is designed to integrate with the company's FT-IR microscopes. According to the company, the accessory provides enhanced spatial resolution and high-speed data acquisition capabilities for FT-IR chemical imaging applications such as composite structures, paper products, pharmaceutical dosage forms, biological tissures, and polymer films and coatings. Thermo Fisher Scientific, Inc., Madison, WI;

Glow discharge OES system

The GD-Profiler 2 RF glow discharge optical emission spectroscopy system from Horiba Scientific is designed to provide ultrafast elemental bulk, surface, and depth profile analysis. According to the company, the system utilizes controlled sputtering of a material by a 4-mm diameter plasma, analyzing all elements including gases (N, O, H, Cl) as a function of depth in conductive or nonconductive layers and substrates. Samples of varying sizes and shapes can be measured. Horiba Scientific, Edison, NJ;

FT-IR spectrometer

The ALPHA compact FT-IR spectrometer from Bruker Optics has a footprint of 22 cm × 30 cm and a weight of 7 kg. The spectrometer reportedly is insensitive to vibration and can be moved and used without alignment. Accessories include a universal sampling module, ATR sampling modules, a DRIFT module for solid samples, and an external reflection module for large samples such as coated metal, paper, or textiles. Bruker Optics, Inc., Billerica, MA;