SAS Undergraduate Student Travel Grant Applications for the SAS National Meeting at SciX 2021 Due August 15
To encourage undergraduate student research in spectroscopy, the Society for Applied Spectroscopy (SAS) is offering a limited number of travel awards of up to $300 per student to attend the SAS National Meeting at SciX 2021 in Providence, RI. While it is unlikely that this grant will cover all the student's travel costs, reduced hotel rates and registration fees for students are typically available for this conference and aid in keeping travel costs low.
This competitive grant is based on merit and financial need. Undergraduate students in degree programs at two-year and four-year colleges are eligible. The student's research advisor must be an SAS member in good standing at the time of application. The student must present their research to the SciX meeting for presentation as a poster during the Sunday SAS student poster session on Sunday night of the meeting. Send submissions to www.scixconference.org.
An individual student can receive this grant only once during their undergraduate academic career.
Applications for the grant program are due to the SAS by August 15 and must be submitted by the student's research advisor. Decisions on grant recipients will be made in a timely manner and communicated to the student and advisor.
The application consists of:
2) Recommendation letter(s) addressing student's research abilities and merit completed by advisor
3) Financial need statement and approximate travel budget completed by advisor and student
4) Copy of student's abstract as submitted to SciX
Click below to apply:
Please submit your application to:sasadmin@s-a-s.org by August 15.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
