|Articles|August 31, 2017
Supplementary Information: Optimized ICP-MS Analysis of Elemental Impurities in Semiconductor-Grade Hydrochloric Acid
Author(s)Ken Neubauer, Ewa Pruszkowski
These tables and figure are supplementary information to the article "Optimized ICP-MS Analysis of Elemental Impurities in Semiconductor-Grade Hydrochloric Acid."
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These tables and figure are supplementary information to the article "Optimized ICP-MS Analysis of Elemental Impurities in Semiconductor-Grade Hydrochloric Acid," which was published in the September 2017 supplement issue Applications of ICP & ICP-MS Techniques for Today’s Spectroscopists to Spectroscopy (1).
Reference
- K. Neubauer and E. Pruszkowski, Spectroscopy32(s9), 17–26 (2017).
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