A research group led by University of Michigan (UM) (Ann Arbor, Michigan) chemist Kevin J. Kubarych has applied ultrafast spectroscopy to observe the fastest molecular motions of a liquid hovering just above its glass transition temperature.
A research group led by University of Michigan (UM) (Ann Arbor, Michigan) chemist Kevin J. Kubarych has applied ultrafast spectroscopy to observe the fastest molecular motions of a liquid hovering just above its glass transition temperature.
“Progress in demystifying the glass transition can have a wide impact in many other fields, including predicting optical and mechanical properties of polymers and understanding crowded cellular environments of living organisms,” Kubarych said in a statement.
Working with UM chemistry graduate students John King and Matthew Ross, Kubarych found that even on the time scale of picoseconds there are signatures of “dynamic arrest” in which the molecules become locked into their positions and long-range motion grinds to a near halt, though structurally, the glass is indistinguishable from a liquid.
Typically, these effects are observed on much slower time scales of seconds, minutes, or even longer. A paper summarizing the research was published online on April 9 in Physical Review Letters. King is the first author of the paper. Ross is also a doctoral student in the UM Applied Physics Program.
The work was supported by the National Science Foundation (Arlington, Virginia) and the Camille and Henry Dreyfus Foundation (New York, New York).
AI and Satellite Spectroscopy Team Up to Monitor Urban River Pollution in China
April 30th 2025A study from Chinese researchers demonstrates how combining satellite imagery, land use data, and machine learning can improve pollution monitoring in fast-changing urban rivers. The study focuses on non-optically active pollutants in the Weihe River Basin and showcases promising results for remote, data-driven water quality assessments.
New Optical Modeling Method Advances Thin Film Analysis Using Spectroscopic Ellipsometry
April 30th 2025Researchers at Zhejiang University have developed an advanced optical modeling approach using spectroscopic ellipsometry, significantly enhancing the non-destructive analysis of amorphous silicon oxide thin films.