Welcome to our Spectroscopy and Archaeology Content Series!
All of us at Spectroscopy magazine are excited to bring you our second content series, which focuses on the role that spectroscopy has played in advancing archaeological science. This content series spotlights the latest research in this field, recognizing the spectroscopists that are conducting important work in this field to help us understand ancient human civilizations.
Our content series contains 13 original pieces, a couple of which have appeared in previous Spectroscopy print issues. We have two new landing pages for you to explore today. The first one, titled, “A Look Into the Ancient Past,” contains nine original pieces, including two question and answer (Q & A) interviews, conducted by Spectroscopy editors Will Wetzel and Patrick Lavery. This landing page also highlights six recent studies where spectroscopy has played a role in archaeological science, with spectroscopic techniques such as portable X-ray fluorescence (pXRF), Fourier transform infrared (FT-IR), and Raman spectroscopy taking center stage. We also highlight studies that were conducted all over the globe, from Stonehenge to northern Spain to the Middle East.
Our second landing page, titled, “An Inside Look at Ancient Egyptian History,” focuses on studies that were designed to uncover more about Ancient Egypt. This landing page contains four original pieces, including one Q & A interview conducted by our associate editorial director Caroline Hroncich, which examines studying ancient papyrus through non-destructive spectroscopic techniques. This landing page also contains a thorough look at Ancient Egyptian blue pigments used in material culture during the Pharaonic Period, and a couple studies that highlight the use of laser-induced breakdown spectroscopy (LIBS), FT-IR, and Raman spectroscopy in helping elucidate the archaeological record.
To embark on your journey, you can access either landing page below to get started!
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
