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Spectroscopy-07-01-2009
Spectroscopy
2009 Pittcon Product Review: Addendum
August 24, 2009
Articles
24
7
The products and companies listed here were missed or presented incorrectly in our Pittcon Product Review in May.
DXC 2009: X-Ray Analysis Comes to the Rockies
August 24, 2009
Articles
24
7
Spectroscopy previews the 58th Annual Denver X-Ray Conference, to be held July 27–31 in Colorado Springs, Colorado.
Sampling in Mass Spectrometry
August 24, 2009
Columns: Mass Spectrometry Forum
24
7
Columnist Kenneth L. Busch discusses some of the basic considerations for valid sampling, with some examples pertinent to mass spectrometry.
Software Features to Improve Quality Control and Data Validation in the Inorganic Laboratory
August 24, 2009
Columns: Atomic Perspectives
24
7
One of the most difficult tasks in any laboratory is the validation and assurance of all data being reported. Whether or not this is being mandated by a regulating agency, it is imperative that the quality of data from any analysis be controlled. How do the laboratory workers ensure the quality of their reported analyses and how do they demonstrate this quality?
Advantages of High OD Filters to Microscopy
July 01, 2009
Columns: Laser and Optics Interface
24
7
The author discusses the use of filters in optical microscopy and the advantages that have been gained as a result of developments in filter technology.
The Revolution in Energy Dispersive X-Ray Spectrometry: Spectrum Imaging at Output Count Rates Above 1 MHz with the Silicon Drift Detector on a Scanning Electron Microscope
July 01, 2009
Articles
24
7
The author discusses the improvements offered by silicon drift detector energy dispersive X-ray spectrometry (SDD-EDS) systems over the classic Si(Li)-EDS for mapping the compositional microstructure of matter with scanning electron microscopy (SEM).
Market Profile: X-Ray Diffractometry
July 01, 2009
Departments
24
7
X-ray diffractometry (XRD) is an X-ray–based method for determining the crystal structure of a material. Because X-ray wavelengths are of roughly the same size as the interatomic spacings of a crystal, significant diffraction of the waves occurs.
Vol 24 No 7 Spectroscopy July 2009 Regular Issue PDF
July 01, 2009
Issue PDF
24
7
Click the title above to open the Spectroscopy July 2009 regular issue, Vol 24 No 7, in an interactive PDF format.