Spectroscopy-07-01-2009

The products and companies listed here were missed or presented incorrectly in our Pittcon Product Review in May.

Spectroscopy previews the 58th Annual Denver X-Ray Conference, to be held July 27–31 in Colorado Springs, Colorado.

Columnist Kenneth L. Busch discusses some of the basic considerations for valid sampling, with some examples pertinent to mass spectrometry.

One of the most difficult tasks in any laboratory is the validation and assurance of all data being reported. Whether or not this is being mandated by a regulating agency, it is imperative that the quality of data from any analysis be controlled. How do the laboratory workers ensure the quality of their reported analyses and how do they demonstrate this quality?

The author discusses the use of filters in optical microscopy and the advantages that have been gained as a result of developments in filter technology.

The author discusses the improvements offered by silicon drift detector energy dispersive X-ray spectrometry (SDD-EDS) systems over the classic Si(Li)-EDS for mapping the compositional microstructure of matter with scanning electron microscopy (SEM).

Product Resources

X-ray diffractometry (XRD) is an X-ray–based method for determining the crystal structure of a material. Because X-ray wavelengths are of roughly the same size as the interatomic spacings of a crystal, significant diffraction of the waves occurs.

Click the title above to open the Spectroscopy July 2009 regular issue, Vol 24 No 7, in an interactive PDF format.