One of the most difficult tasks in any laboratory is the validation and assurance of all data being reported. Whether or not this is being mandated by a regulating agency, it is imperative that the quality of data from any analysis be controlled. How do the laboratory workers ensure the quality of their reported analyses and how do they demonstrate this quality?
The author discusses the improvements offered by silicon drift detector energy dispersive X-ray spectrometry (SDD-EDS) systems over the classic Si(Li)-EDS for mapping the compositional microstructure of matter with scanning electron microscopy (SEM).
X-ray diffractometry (XRD) is an X-ray–based method for determining the crystal structure of a material. Because X-ray wavelengths are of roughly the same size as the interatomic spacings of a crystal, significant diffraction of the waves occurs.