2009 Pittcon Product Review: Addendum
The products and companies listed here were missed or presented incorrectly in our Pittcon Product Review in May.
Each year, the Pittcon Product Review presents many unique challenges. As the largest editorial project of the year, many hours go into ensuring that the review is as comprehensive as possible and that no stone is left unturned. Unfortunately, however, it does occasionally happen that a new product is missed, listed incorrectly, or otherwise presented erroneously. The products and companies listed here fall into one or more of these categories and it is our hope that this Addendum will present readers with a more complete picture of the spectroscopic products available at Pittcon 2009.
Hellma USA
Product Name: MCS FLEX Spectrometer Modules
Design Features: Suited for mobile measuring systems, the MCS FLEX line of spectrometer modules are comprised of an image grating, an optical input, and a receiver array (CCD or PDA). The overall configuration results in a spectral pixel resolution of 0.8 nm/pixel, enabling a spectral resolution of better than 3 nm, in accordance with the Rayleigh criterion. Depending on the detector used, the modules are offered as MCS FLEX CCD (190–980 nm) or MCS FLEX PDA (190–1015 nm).
Product Name: TrayCell
Design Features: This fiber-optics accessory allows photometric measurements of ultra-micro volume samples. With its dimension of a standard cuvette, it works in most spectrophotometers, giving high reproducibility and accuracy. The different caps create a defined optical light path of 0.2 mm and 1 mm. This generates a virtual dilution factor of 1:50 and 1:10, respectively, compared to the measurement in a standard 10 mm cuvette. The required sample volume ranges from 0.7–5μL. On a photometer of average performance, the detection range is about 15 ng/μL–4500 ng/μL.
Product Name: Hellma Calibration Standards
Design Features: These liquid secondary standards are for convenient instrument calibration according to national and international standards. Hellma calibration standards are generally supplied with a certificate of calibration. Recalibration is available on request. All Hellma secondary standards are traceable to internationally accepted NIST primary standards.
HORIBA Jobin Yvon, Inc., A HORIBA Scientific Company
Product name: TemPro Fluorescence Lifetime System
Design features: Compact desktop instrument that uses time-correlated single photon counting (TCSPC), the most sensitive method for fluorescence measurements. Capable of measuring lifetimes ranging from picoseconds to seconds. Covers a broad spectral range by taking advantage of interchangeable pulsed laser diode and LED light sources covering discrete emission wavelengths from 255 nm to the near-IR. Rotational correlation times can be measured using optional poliarizers.
Product name: DynaMyc
Design features: Stand-alone, fully integrated confocal mapping FLIM system. Based on time-correlated single photon counting (TCSPC) technology and featuring new range of PicoBright high repetition rate laser diodes. Offers easy switching between excitation wavelengths and comprehensive software control, including light source, camera, pinholes, and filters. Allows easy access to fluorescence dynamics on the picoseconds to microseconds range for both novices and advanced users.
Product name: CLIP
Design features: CLIP (Collection of Line Intensity Profiles) simplifies analysis in ICP-AES. It assists the analyst in the development of methods for high-resolution sequential ICP-AES with no solutions to prepare or profiles to acquire. The profile of each line is calculated according to the instrument's configuration: focal length, slit combination, diffraction grating, and order used.
The following listing should have been included in the "ACCESSORIES" category:
SPEX CertiPrep
Product name: Calibration standards for ILM 0.5.2 and ILM 0.5.3
• Used for laboratory analysis.
Suggested applications: Analyzing samples with ILM 0.5.3 methods via ICP and ICP-MS.
Primary benefits: Premade reference standards specifically for ILM 0.5.2 and ILM 0.5.3.
Unique features: Manufactured under ISO 9001/A2LA ISO 17025 and Guide 34 Accredited.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.
