Overcoming Key Challenges in Semiconductor Analysis: A Spectroscopy Peer Exchange

The experts explore the challenges of achieving greater efficiency and performance in semiconductor analysis, highlighting advanced techniques capable of detecting trace impurities with precision.

The panelists share their insights and predictions on the evolving role of advanced spectroscopy in shaping the future of semiconductor analysis.

The panelists turn their attention to common obstacles that they face in the lab when analyzing semiconductors using spectroscopic techniques.

The speakers delve into advanced techniques like Fourier-transform infrared spectroscopy (FT-IR) and inductively coupled plasma mass spectrometry (ICP-MS), discussing their strengths and limitations in semiconductor analysis.

We introduce our panelists and dive into the latest trends and challenges in spectroscopic analysis of semiconductors.

Panelists discuss key supply chain challenges that are facing the semiconductor industry right now.