|Articles|September 9, 2021

ASI Standards Introduces PVC Disc Standards for XRF Analysis

ASI Standards recently introduced a new set of polyvinyl chloride (PVC) disc standards designed for XRF analysis.

ASI reportedly developed PVC XRF to meet a calibration standard need that previously did not exist on the market. According to the company, concentrations of PVC standards mirror its polyethylene calibration standards, and, while polyethylene and PVC standards are not interchangeable due to matrix effects, using ASI’s standards, manufacturers can correct matrix effects directly, without the need to use fundamental parameters or indirect methods of calibration. These PVC calibration standards are designed to work with the ASTM F2617-15 method to detect levels of heavy metals in PVC compounds by energy dispersive X-ray spectrometry.

ASI Standards

Oak Ridge North, TX

https://www.asistandards.com/


Related to this article

Brandon E. Boor is the Dr. Margery E. Hoffman Associate Professor in the Lyles School of Civil and Construction Engineering at Purdue University. | Photo Credit: © Brandon Boor.
In the second part of our interview with Brandon Boor of Purdue University, he discusses how his team controls experimental variables during cleaning experiments in order to obtain interpretable data.
Scientist With Portable Spectrometer in Natural Field Setting ©  By Tika -chronicles-stock.adobe.com
The bulky bench-top NIR spectrometer is quietly being dismantled and rebuilt as a wafer-scale photonic chip, a self-calibrating algorithm, and a sensor small enough to ride in a shirt pocket. What once demanded a grating, a moving mirror, and a climate-controlled lab now fits inside a handheld module, a bioreactor probe, or a drone payload, and it increasingly figures out what it is looking at on its own.
Sizing Up the Nanoscale: Measuring Nanocluster Aerosol in Indoor Air
In the first part of a multi-part Q&A, Brandon Boor, the Dr. Margery E. Hoffman Associate Professor in the Lyles School of Civil and Construction Engineering at Purdue University, describes the instrumentation and methodology behind measuring nanoparticle size distributions at the nanocluster scale (1–3 nm) and outlines the technical challenges of acquiring reliable, real-time data at these dimensions.