Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Best of the Week: SciX Award Interviews, Tip-Enhanced Raman Scattering
June 13th 2025Top articles published this week include an interview about aromatic–metal interactions, a tutorial article about the recent advancements in tip-enhanced Raman spectroscopy (TERS), and a news article about using shortwave and near-infrared (SWIR/NIR) spectral imaging in cultural heritage applications.
Hyperspectral Imaging for Walnut Quality Assessment and Shelf-Life Classification
June 12th 2025Researchers from Hebei University and Hebei University of Engineering have developed a hyperspectral imaging method combined with data fusion and machine learning to accurately and non-destructively assess walnut quality and classify storage periods.