A recent conversation with Kevin Wilkinson, a professor of environmental chemistry at the Université de Montréal, sheds light on why no single signature can separate engineered nanoparticles from natural ones.
|Articles|December 1, 2016
- Spectroscopy-12-01-2016
- Volume 31
- Issue 12
Hitachi High-Technologies Science America Inc
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Company Description
HHS-US manufactures and integrates world-class silicon drift x-ray detectors (SDDs) for synchrotron applications as well as for use in analytical instruments. Also supports a network of distributors and partner companies that sell and service ED-XRF and Thermal Analysis instruments, which are manufactured by Hitachi High-Tech Science Corp. in Oyama, Japan. This support includes marketing, logistics, service, applications, and sales throughout the Americas.
Chief Spectroscopic Techniques Supported
- X-ray spectroscopy
- EDXRF
- Thermal Analysis
- DSC
- TG-DTA
Markets Served
HHS-US sells detectors in the synchrotron and analytical instrument fields worldwide. Primarily, ED-XRF instruments are used for thin film analysis in the electronics and coatings industries. Thermal analysis applications are many and varied, but our primary users are in the polymer, food, and pharmaceutical industries.
Major Products/Services
Vortex(r) Silicon Drift Detectors (SDDs) ranging from standard, single element to fully-customize, multi-element designs. The 7000 series of thermal analyzers: DSC7020, DSC7000X, STA7200, STA7300, TMA7000 series, DMA7100 with optional camera systems and other accessories. XRF thin film analyzers: FT110A and F150 series. XRF elemental analysis instruments: EA1000 series, EA1200VX, and EA6000VX.
Facility
Vortex manufacturing in our Northridge facility. Instrument manufacturing in Oyama, Japan. Demonstration labs in Dallas, TX, and Northridge, CA, supported by the demo lab in Tokyo, Japan.
Hitachi High-Technologies Science America, Inc.
19865 Nordhoff St.
Northridge, CA 91324
TELEPHONE
(818) 280-0745
FAX
(818) 280-0408
sales@hitachi-hitec-science.us
WEB SITE
NUMBER OF EMPLOYEES
USA 22
YEAR FOUNDED
2013
Articles in this issue
almost 10 years ago
Raman Thermometryalmost 10 years ago
FT-IR Microscopy with High Spatial Resolutionalmost 10 years ago
Analysis of Metals in Aerosols on Air Filtersalmost 10 years ago
Failure Analysis of Packaging Materialsalmost 10 years ago
Pesticide Detection Using SERS Techniquesalmost 10 years ago
ABB Measurement Analyticsalmost 10 years ago
Anton Paar USA Incalmost 10 years ago
Avantes Incalmost 10 years ago
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