Imaging of Graphene with Combined Raman-AFM, SNOM, Nearfield-Raman, and Raman-SEM (RISE)

March 19, 2015
WITec GmbH


Raman, AFM and SEM imaging provide information regarding the characterization of chemical and structural properties. In this application note you will gain an overview of the WITec imaging techniques through various application examples from graphene research.