WITec GmbH

October 15, 2020

This study shows Raman imaging, atomic force microscopy, and scanning near-field optical microscopy characterizing and depth-profiling polymer blends and layers.

September 10, 2020

See how Raman microscopy in combination with SEM, AFM, topographic imaging, and other methods can characterize chemical and structural properties of geoscience samples.

October 24, 2019

This study shows Raman imaging, atomic force microscopy and scanning near-field optical microscopy characterizing and depth-profiling polymer blends and layers.

September 26, 2019

WITec Application Note: ParticleScout for Automated Confocal Raman Imaging Analysis of Microparticles