WITec GmbH

April 13, 2021

This overview of advanced microparticle analysis shows how particles can be found, classified, and identified automatically using confocal Raman microscopy.

October 15, 2020

This study shows Raman imaging, atomic force microscopy, and scanning near-field optical microscopy characterizing and depth-profiling polymer blends and layers.

September 10, 2020

See how Raman microscopy in combination with SEM, AFM, topographic imaging, and other methods can characterize chemical and structural properties of geoscience samples.

September 01, 2020

This study describes how Raman imaging and correlative Raman scanning electron (RISE) microscopy can characterize and visualize layer numbers in 2D MoS2 and WSe2 samples.

February 01, 2020

The quality and stress field properties of gallium nitride (GaN) crystals must be investigated in order to refine production processes. 3D Confocal Raman microscopy is uniquely capable of the chemical c and visualizing strain in this material.

October 24, 2019

This study shows Raman imaging, atomic force microscopy and scanning near-field optical microscopy characterizing and depth-profiling polymer blends and layers.

September 26, 2019

WITec Application Note: ParticleScout for Automated Confocal Raman Imaging Analysis of Microparticles

September 01, 2019

High-resolution measurements of particles are of great interest in many fields of application. With ParticleScout, WITec has developed a tool that makes it possible to find, classify, and identify particles automatically.

August 23, 2019

This overview of advanced microparticle analysis shows how particles can be found, classified and then identified automatically using confocal Raman microscopy.

February 01, 2019

This application note describes the advantages of a simplified process of searching through Raman spectral databases and creating new ones for example, based on user generated data.