John A. McClean Receives Agilent Thought Leader Award
Agilent Technologies (Santa Clara, California) has awarded an Agilent Thought Leader Award to John A. McLean, who is a Stevenson Professor of Chemistry at Vanderbilt University (Nashville, Tennessee).
Agilent Technologies (Santa Clara, California) has awarded an Agilent Thought Leader Award to John A. McLean, who is a Stevenson Professor of Chemistry at Vanderbilt University (Nashville, Tennessee).
McLean was selected for the award to acknowledge his contributions to ion mobility mass spectrometry (IM–MS) focused on advanced applications, including comprehensive biomolecular systems analysis and synthetic biology. McLean said: “We are grateful to Agilent for this Thought Leader Award because it affirms our research efforts in untargeted broad-scale molecular analysis at the intersection of integrative biology and translational research.”
John C. Fjeldsted, Agilent’s senior director of LC–MS Research and Development said: “We are pleased to recognize John McLean as an Agilent Thought Leader. John and the Vanderbilt team demonstrate a unique combination of driving fundamental instrumental development and pioneering solutions to address tremendously complex real-time biological applications.”
The Agilent Thought Leader Award promotes fundamental scientific advances by contributing financial support, products, and expertise to the research of influential thought leaders in the life sciences, diagnostics, and chemical analysis.
AI and Satellite Spectroscopy Team Up to Monitor Urban River Pollution in China
April 30th 2025A study from Chinese researchers demonstrates how combining satellite imagery, land use data, and machine learning can improve pollution monitoring in fast-changing urban rivers. The study focuses on non-optically active pollutants in the Weihe River Basin and showcases promising results for remote, data-driven water quality assessments.
New Optical Modeling Method Advances Thin Film Analysis Using Spectroscopic Ellipsometry
April 30th 2025Researchers at Zhejiang University have developed an advanced optical modeling approach using spectroscopic ellipsometry, significantly enhancing the non-destructive analysis of amorphous silicon oxide thin films.
