Products
Products
Fluorescence and UV–vis system
Horiba's Dual-FL system reportedly combines a CCD-based benchtop fluorometer with a built-in UV–vis spectrophotometer. According to the company, the instrument provides spectral rates as fast as 80,000 nm/s and a signal-to-noise ratio of greater than 20,000:1 RMS. Horiba Scientific, Edison, NJ;
IMS analyzer
An ion mobility spectrometry (IMS) analyzer from Photonis is designed for simple integration with most mass spectrometers. According to the company, the compact system can be scaled or customized to interface with a variety of instruments to provide simple IMS analysis that can be performed at room temperature. Photonis, Sturbridge, MA;
Microwave digestion
Milestone's UltraWAVE microwave digestion system uses the company's single reaction chamber technology for use in metals digestions. According to the company, the system uses a single pressurized vessel for all samples, allowing for simultaneous digestion of up to 22 samples. The system reportedly can accommodate a maximum temperature of 300 °C and pressure of 199 bar. Milestone, Inc., Shelton, CT;
www.milestonesci.com/ultrawave.
ICP-MS system
Thermo Fisher Scientific's iCAP Q ICP-MS system is designed to provide increased throughput to enable laboratories to cut analysis times by up to 50%. According to the company, the system features an interface that enables one-click setup and allows users to go from standby to performance-qualified analysis with the push of a button. Thermo Fisher Scientific, Inc., San Jose, CA;
Analysis of sulfur in gypsum
An application note from Rigaku describes the use of the company's NEX QC energy dispersive X-ray fluorescence spectrometer in the monitoring of gypsum for quality control during the cement production process. According to the publication, other elements in the gypsum, including calcium, can also be measured. Applied Rigaku Technologies, Austin, TX;
USP 232 standards
SPEX CertiPrep's consumer safety compliance standards now include USP 232 elemental impurities standards. According to the company, the standards can be used as a calibration or check standard to verify oral daily dose PDE, parenteral component limit, or parenteral daily dose PDE. SPEX CertiPrep, Metuchen, NJ;
Silicon drift detector
EDAX's thermoelectrically cooled 50-mm2 silicon drift detector is designed for use in its Orbis micro-XRF elemental analyzer system for high-resolution spectral acquisition. According to the company, the system can be useful for those who make measurements on small fragments, coatings and deposits on thin substrates (such as ink on paper). biological samples, and trace element analysis using heavy filters to improve sensitivity. EDAX, Mahwah, NJ;
UV polarizers
Moxtek's UV wire-grid polarizers are designed for use at wavelengths as low as 250 nm with high transmission, extinction, and angular aperture. According to the company, the product's materials are metal and glass, making it suitable for harsh environments and demanding applications. Moxtek, Orem, UT;
ICP-MS system
The Agilent 8800 triple-quadrupole ICP-MS system is designed to provide improved performance compared with single-quadrupole ICP-MS and to provide MS-MS operation for interference removal in reaction mode. According to the company, the system can be used to analyze elements in life-science, soil, rock, and plant materials. The system reportedly also can be set up to operate like a single-quadrupole ICP-MS system. Agilent Technologies, Santa Clara, CA;
Long-path gas cells
PIKE's long-path IR gas cells are designed for analysis of air contaminants, pure gases, and gas mixtures. According to the company, the fixed-path cells range from 2.4 m to 20 m, and the variable model can be adjusted from 1 m to 16 m. All of the cells reportedly mount rigidly to the baseplate of an FT-IR spectrometer. PIKE Technologies, Madison, WI;
Microvolume UV spectrophotometer
Shimadzu's BioSpec-nano spectrophotometer is designed for fast, reproducible concentration determination of nucleic acids and proteins. The instrument reportedly requires a sample volume of 1 μL (0.2-mm pathlength) or 2 μL (0.7-mm pathlength), which is pipetted onto its measurement plate. No standard rectangular cell is needed, although a rectangular cell adapter is available. According to the company, sample mounting, measurement, and cleaning are performed automatically by the instrument, and measurement time is 3 s. Shimadzu Scientific Instruments, Columbia, MD;
FT-IR microscope
The Lumos stand-alone FT-IR microscope from Bruker Optics is designed for visible inspection and infrared spectral analysis. According to the company, all internal moveable components are motorized and the instrument's software guides operate stepwise through the process of data acquisition. Bruker Optics, Billerica, MA;
www.brukeroptics.com/lumos.html
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
