Spectrometer system
The powerful 50kV, 50 Watt EX-Calibur EDXRF spectrometer system delivers performance capabilities similar to traditional liquid nitrogen-cooled detector units by achieving similar resolution to an LN2 cooled Si(Li) detector.
The powerful 50kV, 50 Watt EX-Calibur EDXRF spectrometer system delivers performance capabilities similar to traditional liquid nitrogen-cooled detector units by achieving similar resolution to an LN2 cooled Si(Li) detector. The analyzer provides non-destructive qualitative and quantitative determination of elements from Na - U. Many industries would benefit from the compact size and powerful analytical capabilities of the EX-Calibur. Jordan Valley, Austin, TX; www.jordanvalley-apd.com
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
