Wavelength, June 2006
Wavelength, June 2006
June 2006
EUROMAR 2006
July 16-21, 2006
york, United Kingdom
Fourth Annual Toxic Industrial Chemical Symposium
July 18-20, 2006
Richmond, VA
Rocky Mountain Conference on Analytical Chemistry
July 23-27, 2006 6
Breckenridge, CO
Conference on Small Molecule Science (CoSMoS)
July 24-27, 2006
San Diego, CA
For more upcoming events, visit Spectroscopy's
Calendar of Events
page
A. Smaller instruments
B. Less expensive instruments
C. Hybrids (such as Raman/FT-IR and Raman/AFM instruments)
What attribute of lasers do you think is important to spectroscopists?
Spectroscopy Publishing/Sales, Editorial, & Marketing Offices
485 Route One South, Building F, Iselin, NJ 08830
tel. (732) 225-9500, fax (732) 225-0211
[email protected], www.spectroscopyonline.com
Click here to contact a Spectroscopy sales representative
Click here to subscribe to the newsletter.
Click here to subscribe to Spectroscopy magazine.
Copyright 2005 Advanstar Communications, Inc. All Rights Reserved.
Click here to access past issues of the e-newsletter.
Advanstar Communications provides certain customer contact data (such as customers' names, addresses, phone numbers and e-mail addresses) to third parties who wish to promote relevant products, services and other opportunities which may be of interest to you. If you do not want Advanstar Communications to make your contact information available to third parties for marketing purposes, simply call 888-527-7008 between the hours of 7:30 am and 5:00 pm CT and a customer service representative will assist you in removing your name from Advanstar's lists. Outside the U.S., please phone 218-723-9477. Contact us by mail at Advanstar Communications Inc., 131 West First St., Duluth, MN 55802-2065. You are currently subscribed to %%list.name%% as %%emailaddr%%. To unsubscribe from this list click here
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
