Good morning, and welcome to this, LCGC's and Spectroscopy's first day of show coverage from the 58th ASMS Conference on Mass Spectrometry and Allied Topics, held this year in Salt Lake City, Utah at the famous Salt Palace Convention Center.
Good morning, and welcome to this, Spectroscopy’s and LCGC’s first day of show coverage from the 58th ASMS Conference on Mass Spectrometry and Allied Topics, held this year in Salt Lake City, Utah at the famous Salt Palace Convention Center. As I mentioned in the editor’s letter of Spectroscopy’s May Current Trends in Mass Spectrometry issue, the ASMS Conference has become the conference industry’s glaring exception, with attendance and popularity among exhibitors growing by the year. In a time when travel budgets and the digital age have begun to diminish the popularity of face-to-face meetings, ASMS continues to grow and thrive, and this year is no exception.
With over 150 exhibitors and nearly 10,000 attendees expected, ASMS 2010 promises to be one of the top two or three events in the field of analytical chemistry this year, and LCGC and Spectroscopy are proud to bring you this comprehensive resource for all that is happening in Salt Lake this week. Whether you are unable to attend this year’s conference, or you are one of the many attendees who simply can’t get to every event and technical session, LCGC and Spectroscopy will bring ASMS 2010 to you.
The show starts off with a bang today as a full slate of technical sessions and posters are on tap. Then tonight the show really gets into full swing with the Award for a Distinguished Contribution in Mass Spectrometry being presented at the plenary lecture at 4:45 in Hall 4. For a complete description of the award and this year’s deserving winner, Dr. Martin Vestal, please see the report from associate editor Meg Evans in this issue. Shortly after this, the hospitality suites will be heating up, and I’m sure no further direction is needed there.
In short, we are looking forward to a great week of science and networking, so please feel free to stop by our booth (#122) and say hello. We’ll see you there.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.