
The combination of microwave sample preparation and ICP-OES is examined to meet the challenges of measuring a suite of heavy metals in a wide range of electronic components for RoHS/WEEE compliance.

The combination of microwave sample preparation and ICP-OES is examined to meet the challenges of measuring a suite of heavy metals in a wide range of electronic components for RoHS/WEEE compliance.

Published: January 1st 2018 | Updated: