The combination of microwave sample preparation and ICP-OES is examined to meet the challenges of measuring a suite of heavy metals in a wide range of electronic components for RoHS/WEEE compliance.
K. Neubauer
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Articles by K. Neubauer
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Testing Electronic Device Components for RoHS/WEEE Compliance Using Microwave Digestion and ICP-OESPublished: January 1st 2018 | Updated:
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