Neil J. Everall

Articles

Depth Profiling with Confocal Raman Microscopy, Part II (PDF)

November 01, 2004

Part II of the two-part series continues the discussion on the interpretation of confocal Raman data, including how depth resolution is degraded when focusing deep within a sample and how intensity variations can occur when focusing near a sample's surface.

Depth Profiling With Confocal Raman Microscopy, Part I (PDF)

October 01, 2004

Raman microscopy is one of the techniques of choice for investigating heterogeneous systems on the micrometer scale. Part I of this two-part article series reviews the issues that must be considered to interpret confocal Raman data correctly.

Mid-infrared Microspectroscopy of Difficult Samples Using Near-Field Photothermal Microspectroscopy (PTMS) [PDF]

February 01, 2004

The authors discuss progress in near-field IR microspectroscopy using a photothermal probe and show how it can be applied to the spectroscopic characterization of real-world samples.

Mid-infrared Microspectroscopy of Difficult Samples Using Near-Field Phtothermal Microspectroscopy (PDF)

February 01, 2004

The authors discuss progress in near-field IR microspectroscopy using a photothermal probe and show how it can be applied to the spectroscopic characterization of real-world samples.