Spectroscopy-07-01-2010

Product Resources

The authors discuss the use of XRF and FT-IR for identifying contaminants in drywall.

Each year, the Pittcon Product Review presents many unique challenges. As the largest editorial project of the year, many hours go into ensuring that the review is as comprehensive as possible and that no stone is left unturned. Unfortunately, however, it does occasionally happen that a new product is missed, listed incorrectly, or otherwise presented erroneously. The products and companies listed here fall into one or more of these categories and it is our hope that this Addendum will present readers with a more complete picture of the spectroscopic products available at Pittcon 2010.

Ken Busch presents a retrospective overview of more than 40 years of mass spectrometry-mass spectrometry (MS-MS) research.

Spectroscopy previews the annual Denver X-Ray Conference, to be held August 2–6, 2010.

X-ray wavelengths correspond to both atomic energy levels and interatomic spacings, enabling X-ray fluorescence (XRF) and X-ray diffraction (XRD) in laboratories.

While viewed as a mature technology, atomic absorption is still an attractive choice, particularly in the area of food safety.

This month's installment of "Laser and Optics Interface" describes CCDs and the new CMOS image sensors and cameras for scientific imaging.

The basic modules of spectrometer systems were discussed in Part 1 of this series, and here, the authors focus on the X-ray excitation sources.

Click the title above to open the Spectroscopy July 2010 regular issue, Vol 25 No 7, in an interactive PDF format.