Spectroscopy
October 01, 2011
Articles
26
10
A critical review focused on the Raman spectroscopy of carbonaceous materials and of polymer-based nanocomposites that contain carbonaceous (nano) materials as fillers
October 01, 2011
Market Profile
26
10
Ellipsometry is a spectroscopic technique used to measure dielectric properties of thin films. Spectroscopic ellipsometry (SE), which is the largest subset of the technique, is a very useful research tool, and is a popular analytical tool in many fast-growing industries. The market for SE is currently in the midst of a very strong upswing in demand.
October 01, 2011
Articles
26
10
This year's theme, "Transition from Research to Application," emphasized important developments in the field application of LIBS and fundamental knowledge of the technique.
October 01, 2011
Chemometrics in Spectroscopy
26
10
Continued discussion of the classical least squares approach to calibration, with a focus on the reconstruction of mixtures
October 01, 2011
Molecular Spectroscopy Workbench
26
10
How can you navigate the maze of choices for detecting molecular vibrations with mid-infrared (IR), near IR (NIR), and visible (Raman)? Understanding what is being measured, how it is measured, and the advantages and disadvantages of each technique, will help.
October 01, 2011
Article
26
10
In the three decades since its discovery, surface-enhanced Raman scattering (SERS) has been used in numerous applications to increase signal intensity in Raman scattering experiments. The current study provides insight into the more practical aspects of enhanced Raman sampling for laboratory users.
October 01, 2011
Issue PDF
26
10
Click the title above to open the Spectroscopy October 2011 regular issue, Vol 26 No 10, in an interactive PDF format.