Spectroscopy-10-01-2011

ICP-MS for Forensic Applications

A critical review focused on the Raman spectroscopy of carbonaceous materials and of polymer-based nanocomposites that contain carbonaceous (nano) materials as fillers

Short Courses

Ellipsometry is a spectroscopic technique used to measure dielectric properties of thin films. Spectroscopic ellipsometry (SE), which is the largest subset of the technique, is a very useful research tool, and is a popular analytical tool in many fast-growing industries. The market for SE is currently in the midst of a very strong upswing in demand.

This year's theme, "Transition from Research to Application," emphasized important developments in the field application of LIBS and fundamental knowledge of the technique.

Continued discussion of the classical least squares approach to calibration, with a focus on the reconstruction of mixtures

How can you navigate the maze of choices for detecting molecular vibrations with mid-infrared (IR), near IR (NIR), and visible (Raman)? Understanding what is being measured, how it is measured, and the advantages and disadvantages of each technique, will help.

Product Resources

In the three decades since its discovery, surface-enhanced Raman scattering (SERS) has been used in numerous applications to increase signal intensity in Raman scattering experiments. The current study provides insight into the more practical aspects of enhanced Raman sampling for laboratory users.

Click the title above to open the Spectroscopy October 2011 regular issue, Vol 26 No 10, in an interactive PDF format.