Spectroscopy-10-01-2011

Spectroscopy

Spectroscopy Spotlight

October 01, 2011

Departments

26

10

ICP-MS for Forensic Applications

Short Courses

October 01, 2011

Departments

26

10

Short Courses

Market Profile: Spectroscopic Ellipsometry

October 01, 2011

Market Profile

26

10

Ellipsometry is a spectroscopic technique used to measure dielectric properties of thin films. Spectroscopic ellipsometry (SE), which is the largest subset of the technique, is a very useful research tool, and is a popular analytical tool in many fast-growing industries. The market for SE is currently in the midst of a very strong upswing in demand.

Review of the Third North American Symposium on Laser-Induced Breakdown Spectroscopy (NASLIBS) 2011 Conference

October 01, 2011

Articles

26

10

This year's theme, "Transition from Research to Application," emphasized important developments in the field application of LIBS and fundamental knowledge of the technique.

Analytical Vibrational Spectroscopy - NIR, IR, and Raman

October 01, 2011

Molecular Spectroscopy Workbench

26

10

How can you navigate the maze of choices for detecting molecular vibrations with mid-infrared (IR), near IR (NIR), and visible (Raman)? Understanding what is being measured, how it is measured, and the advantages and disadvantages of each technique, will help.

Improved Principal Component Discrimination of Commercial Inks Using Surface-Enhanced Resonant Raman Scattering

October 01, 2011

Article

26

10

In the three decades since its discovery, surface-enhanced Raman scattering (SERS) has been used in numerous applications to increase signal intensity in Raman scattering experiments. The current study provides insight into the more practical aspects of enhanced Raman sampling for laboratory users.

Vol 26 No 10 Spectroscopy October 2011 Regular Issue PDF

October 01, 2011

Issue PDF

26

10

Click the title above to open the Spectroscopy October 2011 regular issue, Vol 26 No 10, in an interactive PDF format.