ABB has been awarded a contract worth around $30 million by the Canadian data and analytics company EarthDaily Analytics Corporation (EDA) to develop and manufacture next-generation multispectral imaging systems to be placed on 10 satellites, including an in-orbit spare, that will circle the earth.
The order, booked in the first quarter of 2022, means that the EarthDaily Constellation network of satellites will provide high-quality imagery in 22 spectral bands with resolution down to five meters. As the satellites circle the Earth, ABB’s technology will continuously capture images of the Earth’s land masses and large maritime areas. Using its artificial intelligence-based analytics system, EDA will process the data gathered from the images based on any recorded changes and generate actionable insights that will include information about the state of Earth’s ecosystems, and about the impact and progress of climate changes.
Data provided by the measurements taken by the imaging systems will assist scientists in addressing other challenges such as the monitoring of crop health, conservation, sustainable resource management, and the prediction of forest fire trajectories.
ABB will collaborate with an IT solutions specialist from Xiphos Systems corporation on high-performance processing electronics, and with Loft Orbital, the space infrastructure service provider for EarthDaily Constellation.
An Enhanced Approach to Analytical Instrument and System Qualification
May 1st 2025United States Pharmacopoeia (USP) general chapter <1058> on Analytical Instrument Qualification (AIQ) now has a new title from a draft update for public comment: Analytical Instrument and System Qualification (AISQ). A new three-phase integrated lifecycle phase approach to qualification and validation is described. But will laboratories and suppliers implement it?
New Optical Modeling Method Advances Thin Film Analysis Using Spectroscopic Ellipsometry
April 30th 2025Researchers at Zhejiang University have developed an advanced optical modeling approach using spectroscopic ellipsometry, significantly enhancing the non-destructive analysis of amorphous silicon oxide thin films.