Alluxa, Inc.
Company Description
Alluxa offers and manufactures high-performance optical thin films that are used in wide ranging applications including life sciences, research, semiconductor, and LIDAR. All of Alluxa's thin-film optical filters and mirrors are hard-coated using a proprietary plasma deposition process on equipment that was designed and built by our team. This allows us to repeatably produce the same high-performance optical thin films in all of our coating chambers.
Alluxa is an ISO 9001:2008 certified, ITAR registered, optical coating manufacturer located in Santa Rosa, California. Founded in 2007 by a team of thin-film deposition veterans, Alluxa's core team brings together decades of expertise and diverse backgrounds in deposition, automation, metrology, and optics.
Chief Spectroscopic Techniques Supported
- We support all chief spectroscopic techniques
Markets Served
We serve a wide range of markets including: Aerospace, astronomy, automotive, biotechnology, chemical technology, communications, environmental monitoring and sensing, forensic science, imaging, inspection and identification, lighting, machine vision, research, medical and biomedical, microscopy, military, photonics manufacturing, remote sensing, LIDAR, and spectroscopy.
Major Products/Services
- Ultra Narrow Bandpass Filters
- Ultra Series Thin Films
- Soft Coating Replacement Filters
- Custom & OEM Filters
Facility
Santa Rosa, California
Alluxa, Inc.
3660 N Laughlin Rd.
Santa Rosa, CA 95403
TELEPHONE
1 (855) 4ALLUXA
FAX
(707) 284-1371
E-MAILino@alluxa.com
WEB SITEwww.alluxa.com
NUMBER OF EMPLOYEES
USA: 65
YEAR FOUNDED
2007
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
