Call for Nominations: 2021 SAS Atomic Spectroscopy Student Award
The Society for Applied Spectroscopy (SAS) and the SAS Atomic Technical Section is currently seeking nominations for the 2021 SAS Atomic Spectroscopy Student Award.
The Society for Applied Spectroscopy (SAS) and the SAS Atomic Technical Section are pleased to announce the call for submissions to the 2021 SAS Atomic Spectroscopy Student Award. This award will be given to undergraduate and graduate students who have excelled in the area of atomic spectroscopy.
Selected students will be required to present their work as an oral presentation at SciX 2021, which will be held in Providence, Rhode Island, from September 26–October 1.
The 2021 SAS Atomic Spectroscopy Student Award will come with travel assistance greater than $500 and a two-year SAS membership after graduation.
To apply or recommend a student, please submit the following materials:
- letter of recommendation from the student’s academic advisor
- the student’s current resume/CV
- a scientific abstract for the work he or she will present if selected.
These application documents should be emailed to Derrick Quarles and Ben Manard at atomic.section@s-a-s.org no later than March 1, 2021. Late applications will not be accepted. Award winners will be notified in April 2021.
Students that submit an application for the award must be a current SAS member or register at the time of submission. Student memberships can be completed online by clicking here, or by phone (+1-301-694-8122).
All questions regarding the 2021 SAS Atomic Spectroscopy Student Award should be directed to SAS at the following email address: atomic.section@s-a-s.org.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
