Spectroscopy magazine is seeking contributed manuscripts for its August 2013 supplement on Fourier transform-infrared (FT-IR) spectroscopy.
Spectroscopy
magazine is seeking contributed manuscripts for its August 2013 supplement on FT-IR spectroscopy. Suitable papers will discuss recent advances in the methods or its applications.
Readers may wish to review our 2012 and 2011 supplements.
Manuscripts should be approximately 2,000-2,500 words long, plus figures and tables as needed, including an abstract of approximately 150-200 words. Applications articles should follow a standard experimental article format. Figures and tables, along with their captions, should appear at the end of the manuscript, and figures also must be sent as separate files, preferably in JPG, TIF, PNG, or XLS format. References should be called out using numbers in parentheses and listed at the end of the manuscript in numerical order.
Complete author guidelines are available at the following link: guidelines
Due date for abstract submission: May 22, 2013
Due date for completed articles: July 1, 2013
Suggested article length: ~2000–2500 words, plus figures and tables as needed
Where to submit: Send all proposals and completed articles to Editor Laura Bush.
(tel. +1.732.346.3020).
About Spectroscopy:
Researchers Develop Adaptive Gap-Tunable SERS Device
April 24th 2024In a new study, researchers from Ulsan National Institute of Science and Technology and Pohang University of Science and Technology presented a new surface-enhanced Raman spectroscopy (SERS) device, improving gap plasmon resonance.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
The World of Microplastics Up to Date – an Overview
April 23rd 2024Watch this 20-minute educational video by Andreas Kerstan, Agilent Product Specialist in molecular spectroscopy, to gain a comprehensive update on the microplastics landscape and the environmental concerns related to them. Discover the current challenges in microplastics characterization and how Agilent innovative solutions and techniques, including FTIR, LDIR, GC/MS, and ICP-MS, are addressing these issues head-on.