Challenges for Raman
Monday afternoon?s 2PM session titled, ?Challenges for Raman,? will discuss topics ranging from calibrating spectrographs to transferring chemometric models between hand-held Raman systems and more.
Monday afternoon’s 2PM session titled, “Challenges for Raman,” will discuss topics ranging from calibrating spectrographs to transferring chemometric models between hand-held Raman systems and more.
The first topic addressed, “A Novel Method for Calibration of Imaging Spectrographs,” will be given by Jason McClure, of Princeton Instruments. Following this presentation will be “Alignment of Raman Spectra for Calibration Maintenance,” given by Wesley of Applied Physics Lab.
Next will be an interesting talk given by Robert L. Green of Ahura Scientific titled, “Transfer of Chemometric Models Between Handheld Raman Systems: A Case Study Involving More than 2000 Fielded Systems.”
Following this topic is another discussion regarding the challenges and rewards involved in this science (“Process Raman:Challenges and Rewards”) given by Brian Marquardt of the University of Washington.
Charles Gardner of ChemImage Corporation will give a presentation in conjuction with Applied Perception, Inc. and the US Army TATRC titled, “Integration of a Proximity Raman Hyperspectral Imaging Chemical, Biological and Explosives (CBE) Detector on a Small Unmanned Ground Vehicle.”
Finally, closing out this interesting session will be, “Status of Small Robot-Mounted or Hand-Held, Solar-Blind, Standoff Chemical, Biological, and Explosives (CBE) Sensors,” presented by William Hug on behalf of Photon Systems, Inc. and Caltech, JPL.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
